"I'm looking at writing a "NOR..." <- > <@korken89:matrix.org> I'm looking at writing a "NOR flash mock" for testing, where the normal read/write parts of it are done. However I want to add tests to see that the storage library correctly handles flash corruption when one has exhausted the number of write/erase cycles. > > So I'm thinking about add above some number of writes random bit flips are introduced and maybe even general random failures from the flash controller saying a write failed. Is there something else anyone here would add to get "a good model of a flash"? > > My googling points me to the things I'm planning to add already. There's a model for testing that exists in sequential-storage you can use